|
| |
Investigation of nanostructure fabrication /
characterization techniques and the development /
application of physical and electrical characterization
techniques for the understanding of MOS device
physics/reliability and the operation of nanoelectronic
memory devices. |
|
| 1. |
Growth and characterization of nanostructures
for memory devices. |
| 2. |
Growth and characterization of semiconductor nanostructures
for thermoelectric application. |
| 3. |
Scanning capacitance microscopy /
spectroscopy. |
|